The statement "All can detect features below 100nm" is true for Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM). These techniques are capable of imaging at the nanometer scale.

The statement "All work under vacuum conditions" is true for SEM and TEM, but not for AFM. SEM and TEM require a vacuum to operate because they use electron beams which can be scattered by air molecules. However, AFM does not use an electron beam and can work in a variety of environments including air and liquid, not just vacuum.

The statement "All use electron beam for imaging" is not true. While SEM and TEM use an electron beam for imaging, AFM does not. AFM uses a physical probe to scan the surface of the sample and does not involve electron beams.

So, the only completely true statement regarding AFM, SEM, and TEM is "All can detect features below 100nm".

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The statement "All can detect features below 100nm" is true for Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM). These techniques are capable of imaging at the nanometer scale.

The statement "All work under vacuum conditions" is true for SEM and TEM, but not for AFM. SEM and TEM require a vacuum to operate because they use electron beams which can be scattered by air molecules. However, AFM does not use an electron beam and can work in a variety of environments including air and liquid, not just vacuum.

The statement "All use electron beam for imaging" is not true. While SEM and TEM use an electron beam for imaging, AFM does not. AFM uses a physical probe to scan the surface of the sample and does not involve electron beams.

So, the only completely true statement regarding AFM, SEM, and TEM is "All can detect features below 100nm".

Knowee AI · Accepted Answer

The statement "All can detect features below 100nm" is true for Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM). These techniques are capable of imaging at the nanometer scale.

The statement "All work under vacuum conditions" is true for SEM and TEM, but not for AFM. SEM and TEM require a vacuum to operate because they use electron beams which can be scattered by air molecules. However, AFM does not use an electron beam and can work in a variety of environments including air and liquid, not just vacuum.

The statement "All use electron beam for imaging" is not true. While SEM and TEM use an electron beam for imaging, AFM does not. AFM uses a physical probe to scan the surface of the sample and does not involve electron beams.

So, the only completely true statement regarding AFM, SEM, and TEM is "All can detect features below 100nm".

Which is true regarding Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM)?1 pointAll can detect features below 100nmAll work under vacuum conditionsAll use electron beam for imaging

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